Yu Huang. EDT dynamic bandwidth management (DBM) in SoC testing. In Karan S. Bhatia, Massimo Alioto, Danella Zhao, Andrew Marshall, Ramalingam Sridhar, editors, 29th IEEE International System-on-Chip Conference, SOCC 2016, Seattle, WA, USA, September 6-9, 2016. pages 58-63, IEEE, 2016. [doi]
Abstract is missing.