Yu Huang 0005, Brady Benware, Wu-Tung Cheng, Ting-Pu Tai, Feng-Ming Kuo, Yuan-Shih Chen. Case study of scan chain diagnosis and PFA on a low yield wafer. In Ron Press, Erik H. Volkerink, editors, 2011 IEEE International Test Conference, ITC 2010, Austin, TX, USA, November 2-4, 2010. pages 818, IEEE, 2010. [doi]
Abstract is missing.