Testing and characterization of the one-bit first-order delta-sigma modulator for on-chip analog signal analysis

Jiun-Lang Huang, Kwang-Ting Cheng. Testing and characterization of the one-bit first-order delta-sigma modulator for on-chip analog signal analysis. In Proceedings IEEE International Test Conference 2000, Atlantic City, NJ, USA, October 2000. pages 1021-1030, IEEE Computer Society, 2000.

Abstract

Abstract is missing.