Current-dependent hot-electron stresses on InGaP-gated and AlGaAs-gated low noise PHEMTs

Hou-Kuei Huang, Cieh-Pin Chang, Mau-Phon Houng, Yeong-Her Wang. Current-dependent hot-electron stresses on InGaP-gated and AlGaAs-gated low noise PHEMTs. Microelectronics Reliability, 46(12):2038-2043, 2006. [doi]

Abstract

Abstract is missing.