Jun-Fu Huang, Victor C. Y. Chang, Sally Liu, Kelvin Y. Y. Doong, Keh-Jeng Chang. Modeling Sub-90nm On-Chip Variation Using Monte Carlo Method for DFM. In Proceedings of the 12th Conference on Asia South Pacific Design Automation, ASP-DAC 2007, Yokohama, Japan, January 23-26, 2007. pages 221-225, IEEE, 2007. [doi]
Abstract is missing.