Reliability analysis for flexible electronics: Case study of integrated a-Si: H TFT scan driver

Tsung-Ching Huang, Kwang-Ting (Tim) Cheng, Huai-Yuan Tseng, Chen-Pang Kung. Reliability analysis for flexible electronics: Case study of integrated a-Si: H TFT scan driver. JETC, 4(3), 2008. [doi]

Abstract

Abstract is missing.