Ling Huang, Deruo Cheng, XuLei Yang, Tong Lin, Yiqiong Shi, Kaiyi Yang, Bah-Hwee Gwee, Bihan Wen. Joint Anomaly Detection and Inpainting for Microscopy Images Via Deep Self-Supervised Learning. In 2021 IEEE International Conference on Image Processing, ICIP 2021, Anchorage, AK, USA, September 19-22, 2021. pages 3497-3501, IEEE, 2021. [doi]
Abstract is missing.