A tomographic flow imaging system based on capacitance measuring techniques

S.-M. Huang, T. Dyakowski, C. G. Xie, A. B. Plaskowski, L. A. Xu, M. S. Beck. A tomographic flow imaging system based on capacitance measuring techniques. In 9th International Conference on Pattern Recognition, ICPR 1988, 14-17 November 1988, Ergife Palace Hotel, Rome, Italy. pages 570-572, IEEE, 1988. [doi]

Authors

S.-M. Huang

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T. Dyakowski

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C. G. Xie

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A. B. Plaskowski

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L. A. Xu

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M. S. Beck

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