The Influences of Emotional Reactions on Learning Gains During a Computerized Self-Assessment Test

Yueh-Min Huang, Chin-Fei Huang, Ming-Chi Liu, Chang-Tzuoh Wu. The Influences of Emotional Reactions on Learning Gains During a Computerized Self-Assessment Test. In Yueh-Min Huang, Han-Chieh Chao, Der-Jiunn Deng, James J. Park, editors, Advanced Technologies, Embedded and Multimedia for Human-centric Computing - HumanCom and EMC 2013 [International Conference on Human-centric Computing, HumanCom 2013 / 8th International Conference on Embedded and Multimedia Computing, EMC 2013, Taipei, Taiwan, August 23-25, 2013]. Volume 260 of Lecture Notes in Electrical Engineering, pages 183-188, Springer, 2013. [doi]

@inproceedings{HuangHLW13-1,
  title = {The Influences of Emotional Reactions on Learning Gains During a Computerized Self-Assessment Test},
  author = {Yueh-Min Huang and Chin-Fei Huang and Ming-Chi Liu and Chang-Tzuoh Wu},
  year = {2013},
  doi = {10.1007/978-94-007-7262-5_21},
  url = {http://dx.doi.org/10.1007/978-94-007-7262-5_21},
  researchr = {https://researchr.org/publication/HuangHLW13-1},
  cites = {0},
  citedby = {0},
  pages = {183-188},
  booktitle = {Advanced Technologies, Embedded and Multimedia for Human-centric Computing - HumanCom and EMC 2013 [International Conference on Human-centric Computing, HumanCom 2013 / 8th International Conference on Embedded and Multimedia Computing, EMC 2013, Taipei, Taiwan, August 23-25, 2013]},
  editor = {Yueh-Min Huang and Han-Chieh Chao and Der-Jiunn Deng and James J. Park},
  volume = {260},
  series = {Lecture Notes in Electrical Engineering},
  publisher = {Springer},
  isbn = {978-94-007-7261-8},
}