Der-Cheng Huang, Wen-Ben Jone, Sunil R. Das. A Parallel Built-In Self-Diagnostic Method For Embedded Memory Buffers. In 14th International Conference on VLSI Design (VLSI Design 2001), 3-7 January 2001, Bangalore, India. pages 397-402, IEEE Computer Society, 2001. [doi]
Abstract is missing.