Low-Cost Analog/RF IC Testing Through Combined Intra- and Inter-Die Correlation Models - researchr publication

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Ke Huang, Nathan Kupp, Constantinos Xanthopoulos, John M. Carulli Jr., Yiorgos Makris. Low-Cost Analog/RF IC Testing Through Combined Intra- and Inter-Die Correlation Models. IEEE Design & Test of Computers, 32(1):53-60, 2015. [doi]

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