Jing Huang, Mariam Momenzadeh, Mehdi Baradaran Tahoori, Fabrizio Lombardi. Defect Characterization for Scaling of QCA Devices. In 19th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2004), 10-13 October 2004, Cannes, France, Proceedings. pages 30-38, IEEE Computer Society, 2004. [doi]
Abstract is missing.