Research and Application of Hausdorff Metric Based i-v Vague Clustering Method

M. Huang, Z. X. Xia, Q. H. Zeng. Research and Application of Hausdorff Metric Based i-v Vague Clustering Method. In Second International Conference on Digital Manufacturing and Automation, ICDMA 2011, Zhangjiajie, Hunan, China, August 5-7, 2011. pages 900-905, IEEE, 2011. [doi]

@inproceedings{HuangXZ11,
  title = {Research and Application of Hausdorff Metric Based i-v Vague Clustering Method},
  author = {M. Huang and Z. X. Xia and Q. H. Zeng},
  year = {2011},
  doi = {10.1109/ICDMA.2011.223},
  url = {http://doi.ieeecomputersociety.org/10.1109/ICDMA.2011.223},
  researchr = {https://researchr.org/publication/HuangXZ11},
  cites = {0},
  citedby = {0},
  pages = {900-905},
  booktitle = {Second International Conference on Digital Manufacturing and Automation, ICDMA 2011, Zhangjiajie, Hunan, China, August 5-7, 2011},
  publisher = {IEEE},
  isbn = {978-1-4577-0755-1},
}