Empirical-Statistics Analysis for Zero-Failure GaAs MMICs Life Testing Data

Zheng-Liang Huang, Fa-Xin Yu, Shu-Ting Zhang, Hao Luo, Ping-Hui Wang, Yao Zheng. Empirical-Statistics Analysis for Zero-Failure GaAs MMICs Life Testing Data. IEICE Transactions, 92-A(9):2376-2379, 2009. [doi]

Abstract

Abstract is missing.