Shi-Yu Huang, Chih-Chieh Zheng. Die-to-Die Clock Skew Characterization and Tuning for 2.5D ICs. In 25th IEEE Asian Test Symposium, ATS 2016, Hiroshima, Japan, November 21-24, 2016. pages 221-226, IEEE Computer Society, 2016. [doi]
Abstract is missing.