Tim Hübener, Michel R. V. Chaudron, Yaping Luo, Pieter Vallen, Jonck van der Kogel, Tom Liefheid. Automatic Anti-Pattern Detection in Microservice Architectures Based on Distributed Tracing. In 44th IEEE/ACM International Conference on Software Engineering: Software Engineering in Practice, ICSE (SEIP) 2022, Pittsburgh, PA, USA, May 22-24, 2022. pages 75-76, IEEE, 2022. [doi]
Abstract is missing.