Dielectric property measurement of PLA

E. Huber, M. Mirzaee, J. Bjorgaard, M. Hoyack, S. Noghanian, I. Chang. Dielectric property measurement of PLA. In 2016 IEEE International Conference on Electro Information Technology, EIT 2016, Grand Forks, ND, USA, May 19-21, 2016. pages 788-792, IEEE, 2016. [doi]

Abstract

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