G. Hubert, A. Bougerol, F. Miller, N. Buard, Lorena Anghel, T. Carriere, F. Wrobel, R. Gaillard. Prediction of Transient Induced by Neutron/Proton in CMOS Combinational Logic Cells. In 12th IEEE International On-Line Testing Symposium (IOLTS 2006), 10-12 July 2006, Como, Italy. pages 63-74, IEEE Computer Society, 2006. [doi]
Abstract is missing.