Landis M. Huffman, Jeff P. Simmons, Ilya Pollak. Segmentation of digital microscopy data for the analysis of defect structures in materials using nonlinear diffusions. In Charles A. Bouman, Eric L. Miller, Ilya Pollak, editors, Computational Imaging VI, part of the IS&T-SPIE Electronic Imaging Symposium, San Jose, CA, USA, January 28-29, 2008, Proceedings. Volume 6814 of SPIE Proceedings, pages 68140, SPIE, 2008.
Abstract is missing.