Multiple Stuck-At Fault Coverage of Single Stuck-At Fault Test Sets - researchr publication

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Joseph L. A. Hughes, Edward J. McCluskey. Multiple Stuck-At Fault Coverage of Single Stuck-At Fault Test Sets. In Proceedings International Test Conference 1986, Washington, D.C., USA, September 1986. pages 368-374, IEEE Computer Society, 1986.

Abstract is missing.

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