A Comprehensive Informative Metric for Analyzing HPC System Status Using the LogSCAN Platform

Yawei Hui, Byung-Hoon Park, Christian Engelmann. A Comprehensive Informative Metric for Analyzing HPC System Status Using the LogSCAN Platform. In IEEE/ACM 8th Workshop on Fault Tolerance for HPC at eXtreme Scale, FTXS@SC 2018, Dallas, TX, USA, November 16, 2018. pages 29-38, IEEE, 2018. [doi]

Abstract

Abstract is missing.