Jiali Huo, Weixing Huang, Fan Zhang, Shengli Zhang, Weizhuo Gan, Qiang Huo, Yuwei Cai, Qingzhu Zhang, Yongliang Li, Huilong Zhu, Huaxiang Yin, Zhenhua Wu. Investigation on negative capacitance FinEFT beyond 7 nm node from device to circuit. Microelectronics Journal, 116:105196, 2021. [doi]
Abstract is missing.