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TID-induced leakage-assisted degradation and failure mechanisms in cathode-short base-resistance-controlled thyristors

Xuanyi Huo, LiMei Song, Xiaowu Cai, Longli Pan, Jian Lu, Lei Shu, Bo Li 0051. TID-induced leakage-assisted degradation and failure mechanisms in cathode-short base-resistance-controlled thyristors. Microelectronics Journal, 174:107212, 2026. [doi]

Authors

Xuanyi Huo

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LiMei Song

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Xiaowu Cai

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Longli Pan

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Jian Lu

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Lei Shu

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Bo Li 0051

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