Xuanyi Huo, LiMei Song, Xiaowu Cai, Longli Pan, Jian Lu, Lei Shu, Bo Li 0051. TID-induced leakage-assisted degradation and failure mechanisms in cathode-short base-resistance-controlled thyristors. Microelectronics Journal, 174:107212, 2026. [doi]
@article{HuoSCPLSL26,
title = {TID-induced leakage-assisted degradation and failure mechanisms in cathode-short base-resistance-controlled thyristors},
author = {Xuanyi Huo and LiMei Song and Xiaowu Cai and Longli Pan and Jian Lu and Lei Shu and Bo Li 0051},
year = {2026},
doi = {10.1016/j.mejo.2026.107212},
url = {https://doi.org/10.1016/j.mejo.2026.107212},
researchr = {https://researchr.org/publication/HuoSCPLSL26},
cites = {0},
citedby = {0},
journal = {Microelectronics Journal},
volume = {174},
pages = {107212},
}