The complexity of readiness and failure equivalences for processes

Dung T. Huynh, Lu Tian. The complexity of readiness and failure equivalences for processes. In Proceedings of the Third IEEE Symposium on Parallel and Distributed Processing, SPDP 1991, 2-5 December 1991, Dallas, Texas, USA. pages 738-745, IEEE Computer Society, 1991. [doi]

Abstract

Abstract is missing.