Jonghwan Hyeon, Ho-Jin Choi, Kap No Lee, Byung Doo Lee. Automating Papanicolaou Test Using Deep Convolutional Activation Feature. In 18th IEEE International Conference on Mobile Data Management, MDM 2017, Daejeon, South Korea, May 29 - June 1, 2017. pages 382-385, IEEE Computer Society, 2017. [doi]
Abstract is missing.