Jeeho Hyun, Sangyun Kim, Giyoung Jeon, Seung Hwan Kim, Kyunghoon Bae, Byung Jun Kang. ReConPatch : Contrastive Patch Representation Learning for Industrial Anomaly Detection. In IEEE/CVF Winter Conference on Applications of Computer Vision, WACV 2024, Waikoloa, HI, USA, January 3-8, 2024. pages 2041-2050, IEEE, 2024. [doi]
Abstract is missing.