Sami Hyvonen, Sopan Joshi, Elyse Rosenbaum. Comprehensive ESD protection for RF inputs. Microelectronics Reliability, 45(2):245-254, 2005. [doi]
@article{HyvonenJR05,
title = {Comprehensive ESD protection for RF inputs},
author = {Sami Hyvonen and Sopan Joshi and Elyse Rosenbaum},
year = {2005},
doi = {10.1016/j.microrel.2004.05.012},
url = {http://dx.doi.org/10.1016/j.microrel.2004.05.012},
researchr = {https://researchr.org/publication/HyvonenJR05},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {45},
number = {2},
pages = {245-254},
}