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Fault-based reliable design-on-upper-bound of electronic systems for terrestrial radiation including muons, electrons, protons and low energy neutrons

Eishi Ibe, Tadanobu Toba, Ken-ichi Shimbo, Hitoshi Taniguchi. Fault-based reliable design-on-upper-bound of electronic systems for terrestrial radiation including muons, electrons, protons and low energy neutrons. In 18th IEEE International On-Line Testing Symposium, IOLTS 2012, Sitges, Spain, June 27-29, 2012. pages 49-54, IEEE Computer Society, 2012. [doi]

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