Ahmed Ibrahim, Hans G. Kerkhoff. A cost-efficient dependability management framework for self-aware system-on-chips based on IEEE 1687. In 23rd IEEE International Symposium on On-Line Testing and Robust System Design, IOLTS 2017, Thessaloniki, Greece, July 3-5, 2017. pages 1-2, IEEE, 2017. [doi]
Abstract is missing.