Structural Analysis of R & D Division from Patent Documents

Yurie Iino, Yasuhiro Yamada, Sachio Hirokawa. Structural Analysis of R & D Division from Patent Documents. In 2008 IEEE International Conference on e-Business Engineering, ICEBE 2008, Xi'an, China, October 22-24, 2008. pages 423-428, IEEE Computer Society, 2008. [doi]

Abstract

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