Tetsuya Iizuka, Makoto Ikeda, Kunihiro Asada. Timing-Driven Redundant Contact Insertion for Standard Cell Yield Enhancement. In 13th IEEE International Conference on Electronics, Circuits, and Systems, ICECS 2006, Nice, France, December 10-13, 2006. pages 704-707, IEEE, 2006. [doi]
Abstract is missing.