Tetsuya Iizuka, Jaehyun Jeong, Toru Nakura, Makoto Ikeda, Kunihiro Asada. All-digital on-chip monitor for PMOS and NMOS process variability measurement utilizing buffer ring with pulse counter. In 36th European Solid-State Circuits Conference, ESSCIRC 2010, Sevilla, Spain, September 13-17, 2010. pages 182-185, IEEE, 2010. [doi]
Abstract is missing.