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Tetsuya Iizuka, Jaehyun Jeong, Toru Nakura, Makoto Ikeda, Kunihiro Asada. All-Digital On-Chip Monitor for PMOS and NMOS Process Variability Utilizing Buffer Ring with Pulse Counter. IEICE Transactions, 94-C(4):487-494, 2011. [doi]
Abstract is missing.