Buffer-ring-based all-digital on-chip monitor for PMOS and NMOS process variability and aging effects

Tetsuya Iizuka, Toru Nakura, Kunihiro Asada. Buffer-ring-based all-digital on-chip monitor for PMOS and NMOS process variability and aging effects. In Elena Gramatová, Zdenek Kotásek, Andreas Steininger, Heinrich Theodor Vierhaus, Horst Zimmermann, editors, 13th IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2010, Vienna, Austria, April 14-16, 2010. pages 167-172, IEEE, 2010. [doi]

Abstract

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