Afroz M. Imam, Deepak M. Divan, Ronald G. Harley, Thomas G. Habetler. Electrolytic Capacitor Failure Mechanism Due to Inrush Current. In Conference Record of the 2007 IEEE Industry Applications Conference Forty-Second IAS Annual Meeting, New Orleans, LA, USA, September 23-27, 2007. pages 730-736, IEEE, 2007. [doi]
Abstract is missing.