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Bit-Flipping Scan - A unified architecture for fault tolerance and offline test

Michael E. Imhof, Hans-Joachim Wunderlich. Bit-Flipping Scan - A unified architecture for fault tolerance and offline test. In Design, Automation & Test in Europe Conference & Exhibition, DATE 2014, Dresden, Germany, March 24-28, 2014. pages 1-6, IEEE, 2014. [doi]

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