Shinkichi Inagaki, Tatsuya Suzuki, Mitsuo Saito, Takeshi Aoki. Local/global fault diagnosis of event-driven controlled systems based on probabilistic inference. In 46th IEEE Conference on Decision and Control, CDC 2007, New Orleans, LA, USA, December 12-14, 2007. pages 2633-2638, IEEE, 2007. [doi]
Abstract is missing.