Process Variation-Aware Test for Resistive Bridges

Urban Ingelsson, Bashir M. Al-Hashimi, S. Saqib Khursheed, Sudhakar M. Reddy, Peter Harrod. Process Variation-Aware Test for Resistive Bridges. IEEE Trans. on CAD of Integrated Circuits and Systems, 28(8):1269-1274, 2009. [doi]

Abstract

Abstract is missing.