Michiko Inoue, Tomokazu Yoneda, Muneo Hasegawa, Hideo Fujiwara. Partial Scan Approach for Secret Information Protection. In 14th IEEE European Test Symposium, ETS 2009, Sevilla, Spain, May 25-29, 2009. pages 143-148, IEEE Computer Society, 2009. [doi]
Abstract is missing.