Bit line coupling memory tests for single-cell fails in SRAMs

Sandra Irobi, Zaid Al-Ars, Said Hamdioui. Bit line coupling memory tests for single-cell fails in SRAMs. In 28th IEEE VLSI Test Symposium, VTS 2010, April 19-22, 2010, Santa Cruz, California, USA. pages 27-32, IEEE Computer Society, 2010. [doi]

Abstract

Abstract is missing.