Masahiro Ishida, Toru Nakura, Toshiyuki Kikkawa, Takashi Kusaka, Satoshi Komatsu, Kunihiro Asada. Power integrity control of ATE for emulating power supply fluctuations on customer environment. In 2012 IEEE International Test Conference, ITC 2012, Anaheim, CA, USA, November 5-8, 2012. pages 1-10, IEEE Computer Society, 2012. [doi]
Abstract is missing.