Masahiro Ishida, Takahiro J. Yamaguchi, Mani Soma, Terri Fiez, Mike Peng Li. Special session 8C: Hot topic: Designers' and test researchers' roles in analog design-for-test. In IEEE 32nd VLSI Test Symposium, VTS 2014, Napa, CA, USA, April 13-17, 2014. pages 1, IEEE, 2014. [doi]
Abstract is missing.