Kimihiro Ishizaki, Tatsuo Ushiki, Masato Nakajima, Futoshi Iwata. Influence of charged samples on imaging in scanning ion conductance microscopy. In International Symposium on Micro-NanoMechatronics and Human Science, MHS 2013, Nagoya, Japan, November 10-13, 2013. pages 1-4, IEEE, 2013. [doi]
Abstract is missing.