Reduction of the Test Time for Mass Produced LSI Devices by Genetic Algorithms

T. Iwamoto, S. Kobashi, Narumi Sakashita, J. Mitsuishi, Ken-ichi Tanaka, Kazuo Kyuma. Reduction of the Test Time for Mass Produced LSI Devices by Genetic Algorithms. In Nikola Kasabov, Robert Kozma 0001, Kitty Ko, Robert O'Shea, George Coghill, Tom Gedeon, editors, Progress in Connectionist-Based Information Systems: Proceedings of the 1997 International Conference on Neural Information Processing and Intelligent Information Systems, ICONIP 1997, Volume I, Dunedin, New Zealand, 24-28 November, 1997. pages 704-707, Springer, 1997.

Abstract

Abstract is missing.