Kazunori Iwata, Toyoshiro Nakashima, Yoshiyuki Anan, Naohiro Ishii. Estimating Interval of the Number of Errors for Embedded Software Development Projects. In IIAI 3rd International Congress on Advanced Applied Informatics, IIAI-AAI 2014, Kokura Kita-ku, Japan, August 31 - Sept. 4, 2014. pages 604-608, IEEE, 2014. [doi]
Abstract is missing.