Vikram Iyengar, Anshuman Chandra. A Uni.ed SOC Test Approach Based on Test Data Compression and TAM Design. In 18th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2003), 3-5 November 2003, Boston, MA, USA, Proceedings. pages 511-518, IEEE Computer Society, 2003. [doi]
Abstract is missing.