Magnetic Tunnel Junction Reliability Assessment Under Process Variations and Activity Factors and Mitigation Techniques

Anirudh Srikant Iyengar, Swaroop Ghosh, Nitin Rathi. Magnetic Tunnel Junction Reliability Assessment Under Process Variations and Activity Factors and Mitigation Techniques. J. Low Power Electronics, 14(2):217-226, 2018. [doi]

Abstract

Abstract is missing.