Subramanian K. Iyer, Debashis Sahoo, E. Allen Emerson, Jawahar Jain. On partitioning and symbolic model checking. IEEE Trans. on CAD of Integrated Circuits and Systems, 25(5):780-788, 2006. [doi]
@article{IyerSEJ06,
title = {On partitioning and symbolic model checking},
author = {Subramanian K. Iyer and Debashis Sahoo and E. Allen Emerson and Jawahar Jain},
year = {2006},
doi = {10.1109/TCAD.2006.870410},
url = {http://doi.ieeecomputersociety.org/10.1109/TCAD.2006.870410},
tags = {model checking, meta-model, e-science, Meta-Environment, partitioning},
researchr = {https://researchr.org/publication/IyerSEJ06},
cites = {0},
citedby = {0},
journal = {IEEE Trans. on CAD of Integrated Circuits and Systems},
volume = {25},
number = {5},
pages = {780-788},
}