M. Jablonski, Riccardo Lucchini, Frederick Bossuyt, Thomas Vervust, Jan Vanfleteren, J. W. C. DeVries, Pasquale Vena, Mario Gonzalez. Impact of geometry on stretchable meandered interconnect uniaxial tensile extension fatigue reliability. Microelectronics Reliability, 55(1):143-154, 2015. [doi]
Abstract is missing.